DOI: 10.1109/test.2013.6651887
Abstract:
To enable high-volume testing of LSIs with high-speed optical and electrical interfaces, we developed a proof-of-concept device of an optical LSI test system for use in mass-production testing. Key technologies include high-density and high-performance optical functional devices and a device interface enabling simultaneous connection of optical and electrical interfaces. Our proposed system, using PLZT thin-film modulators, supports multi-channel optical bit-error-rate (BER) testing of devices with signal rates up to 30 Gb/s with results that...
Excerpt:
Photoreceiver, optical attenuator and switches We used commercially available photorecievers (DSC- R411, Discovery Semiconductor, Inc.) mounted on a sub- module for use as O/E converters. Optical switches (LB series, Agiltron) enable the test functions of the system to be changed without re-connecting the optical and electr i-cal cables. In-line power monitors and attenuators inserted into the system enable the optical power to be controlled and determined during measurement...